The CPEM 2012 Early Career Award Program encourages and helps develop the careers of promising metrology professionals by awarding grants to selected applicants.  These competitive awards may be in the form of waived conference registration and/or financial assistance with transportation and lodging expenses associated with attending CPEM 2012.  Award recipients must either be students in graduate or undergraduate programs, or within the first five years of their career in a metrology-related position.  Applications are encouraged from developing countries.

Applicants will need to meet the following criteria:

• Less than five years experience in metrology-related research, or enrolled in a graduate or undergraduate metrology-related program
• Work or study in an area within the scope of CPEM 2012
• Technical ability and interest, as demonstrated by  paper submitted to CPEM 2012
• Career potential, as evidenced by letter of recommendation from at least one senior metrologist or educator
• Submission of application form with required attachments and signatures by deadline

CPEM 2012 is now accepting applications for the Early Career Program.  Applications are due January 22, 2012

Any queries regarding the Early Career Program should be sent to Mike Janezic.

Past Early Career awardees Angelica M. Muniz-Mercado (left) and Marcos E. Bierzychudek (right) presenting their research at CPEM 2008.

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