The Early Career Award Program was started by CPEM as a means of encouraging promising professionals to enter the field of metrology and to assist in the development of their career.  The program supports scientists from around the world who are in the first five years of their career in metrology, enabling them to attend the Conference.  They were selected on the basis of their interest in metrology, their technical ability, as demonstrated by a paper submitted for presentation at the Conference, and their potential as attested to by at least one senior metrologist or educator who sponsors them.  Applications were especially encouraged from developing countries.  All scholarship awardees are students either in graduate or undergraduate programs, or are employed in a metrology-related position.

CPEM 2008 Early Career Awardees:

The application process for the Early Career Development Program is now closed. Applicants were notified from the determining committee by 29 February 2008.

Applicants who are receiving this award should download the conference registration form and either email (cpem@centennialconferences.com) or fax ([001] 303-499-2599) to Centennial Conferences with a note that states "Early Career Awardee".

Any queries should be sent to Alan H. Cookson in care of sharon.grove@nist.gov. 

Should you need to access the form that was used for the application process, click here.

Please send any suggestions for this website to cpem2008@nist.gov.

This CPEM website is hosted courtesy of
NCSL International